InSe shows high carrier mobility that is attracted in the application of photoelectric detection and field effect transistors. However, InSe is easy to oxide, especially under certain light and thermal excitation, it will oxidize to In2O3. In the research of InSe, Raman spectroscopy and fluorescence spectroscopy are conventional analytical methods that required laser excitation. At present, the influence of laser irradiation on the test results is not clear. In this study, the effects of laser irradiation on the Raman spectrum, surface morphology and surface potential of InSe were studied in detail by using Raman spectroscopy, atomic force microscope and Kelvin probe force microscope. It is found that laser irradiation has little effect on the material when the laser power is under 0.20 mW and exposure time of 10 s. With the increase of laser irradiation power, laser-induced surface oxidation induces structural deformation, decrease of Raman peak intensity and increase of surface potential. With the increase irradiation time of high laser power, the oxidation degree of the surface increases rapidly, but the Raman intensity decreases first, then increases, and then decreases again, which is due to the change of oxidation morphology. This research shows that spectral testing may have a non-negligible impact on InSe materials, which should be paid attention to in material analysis.